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Manual Probing Product Line
Series 8806/8800
Manual Analytical Probers
Manual Analytical Probing Systems are available in two configurations, 8"
(200mm) and 6" (150mm) Diameter Wafers. Both stations are complete with X-Y
Manual Stage/Motor Assist and Chuck.
Series 4440 Micropositioners
SlimLine Micropositioner is a low
cost, high performance solution to probing submicron geometry of integrated
circuits. A novel X axis innovation allows inline XYZ knob control and the
Micropositioner to be used either LH or RH
Series 1000 Probe Points
Probe Points in a wide range of
tip radiuses, materials and lengths to meet most requirements.
Series 1090 Coaxial/Shielded Probes
Co-Ax Shielded Probes for
taking low level measurements of semiconductor
devices.
Series 1050 Probe Point Arms/Holders
Probe Arms and
Fixtures.
Series 8830 Hot/Cold 6" & 8" Chucks
DC Powered Hot Chuck and Controller is a thermally stable system (+/- 0.1C)
with very low electrical or magnetic noise for the environmental testing of
IC wafers
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